Login Sign Up

ASTM E1161-95

Historical Revision

Standard Practice for Radiologic Examination of Semiconductors and Electronic Components

$73.00

$73.00

$131.40


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


...

1.1 This test method provides a standard procedure for nondestructive radiographic examination of semiconductor devices, electronic components, and the materials used for construction of these items. This test method covers the radiographic testing of these items for possible defective conditions such as extraneous material within the sealed case, improper internal connections, voids in materials used for element mounting, or the sealing glass, or physical damage.

1.2 The quality level and acceptance criteria for the specimens being tested shall be specified in the detail drawing, purchase order or contract.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.


SDO ASTM: ASTM International
Document Number E1161
Publication Date Jan. 1, 1995
Language en - English
Page Count 3
Revision Level 95
Supercedes
Committee E07.01
Publish Date Document Id Type View
June 1, 2021 E1161-21 Revision
June 1, 2009 E1161-09 Revision
June 10, 2003 E1161-03 Revision
Jan. 1, 1995 E1161-95 Revision
June 1, 2014 E1161-09R14 Reaffirmation